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FISCHER TECHNOLOGY Coating Thickness Instruments Coating Thickness Gauges & Measurement Instruments - Material Analysis Instruments - Material Testing Instruments - Material Hardness Instruments - Solids - Liquids - Pastes - Powders - Porosity Testing - Microhardness Testing - Martens Hardness Testing - Methods Used: X-Ray Fluorescent / XRF - Beta Backscatter - Magnetic Induction - Eddy Current - Coulometric - Click Here to Enter or Call . . . 800-243-8417 . . . Or . . . (860)683-0781 . . .

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1-FISCHER TECHNOLOGY, INC. - Windsor, CT - - Designers and manufacturers of coating thickness gauges & instruments, material testing instruments, hardness testing and material analysis instruments - The result of years of industry experience and extensive research. FISCHER provides a large variety of testing & analysis instruments for virtually any type of coating thickness related application, material testing and hardness testing.
(800)243-8417, (860)683-0781, FAX: (860)688-8496, E-mail: Request a quote ..... ..

AUTOMATION USA - Gettysburg, PA - - Hand-held coating thickness gauges and other paint/coating related physical test equipment. Recently we have developed several new and innovative test instruments which will measure over both ferrous and non-ferrous substrates. Wireless reading gauges for multiple thickness and hardness testing applications.
(800)678-4370, (717)334-3372, Fax: (717)334-0283, E-mail: Request a quote

AXIC, INC. - Santa Clara, CA - - Our new fully automatic PRECISION 1000-B® production line monitor will characterize the effect of variables on the film deposition process. Once the process is defined it is utilized as a quality control monitor to insure the composition and thickness of the production films in semiconductor, superconductor, magnetic and optical applications.
(408)980-0240, Fax: (408)980-0524, E-mail: Request a quote

BRUNSWICK INSTRUMENT, LLC - Kiel, WI - - Providing the most economical means to achieve accurate, reliable thickness measurements on thin film, foil and soft materials. Our systems provide the necessary high resolution and consistent, accurate results demanded for today's emphasis on quality. Brunswick's XL-750 Digital Gage Amplifier provides .00001"(.001 mm) thickness measurement resolution on materials up to .040" thick.
(920)894-1176, Fax: (920)894-1162, E-mail: Request a quote

BYK-GARDNER, USA - Columbia, MD - - Instruments for measuring very thin coatings. Utilizing dual sensors with magnetic-inductive Fe and NFe probe, byko-test MPOR automatically recognizes the substrate and is not influenced by any premagnetized substrates. Results are displayed on 2 illuminated LCD displays. Integrated radio transmitter transfers readings wirelessly to computer with radio receiver.
(800)343-7721, (301)483-6500, Fax: (301)483-6555, E-mail: Request a quote

DeFELSKO CORPORATION - Ogdensburg, NY - - The measure of quality since 1966. DeFelsko manufactures hand-held, non-destructive coating thickness gages that are ideal for measuring the conformal coating thickness on printed circuit boards and coating thickness gages for measuring coatings on all metals. It is the economical choice that retains the uncompromising quality of DeFelsko inspection instruments.
(800)448-3835, (315)393-4450, Fax: (315)393-8471, E-mail: Request a quote

EASTERN APPLIED RESEARCH, INC. - Lockport, NY - - The new Seiko XRF instrument measures virtually any coating non-destructively. Multilayer applications up to 5 layers, ultra thick gold (200 micro inches) in a multilayer, thin films as low as 20 angstroms, lead-free solder and all constituents. A great production instrument and also a very universal lab analyzer.
(800)792-4477, (716)625-8311, Fax: (716)625-8319, E-mail: Request a quote

ECI TECHNOLOGY, INC. - E. Totowa, NJ - - Semiconductor & printed circuit board surface analysis tool for solderability and wirebondability quality control. Providing a convenient, reproducible, and user-friendly method of analysis for determining the surface conditions of your product to evaluate and predict the solderability, wirebondability and adhesion characteristics of printed circuit boards or semiconductor wafers and lead frames.
(973)890-1114, Fax: (973)890-1118, E-mail: Request a quote

ELCOMETER, INC. - Rochester Hills MI - - Since 1947, world leaders in the manufacturing of a complete range of inspection equipment for the coatings Industry. With two state of the art manufacturing facilities Elcometer has recently expanded our range into industrial metal detection as well as having introduced a wide range of gauge multiplexers and SPC software.
(800)521-0635, (248)650-0500, Fax: (248)650-0501, E-mail: Request a quote

ELECTROMATIC EQUIPMENT CO., INC. - Cedarhurst, NY - - Coating thickness gauges for measuring coatings on ferrous & non-ferrous substrates. Industry-leading precision, simple operation and rugged construction make our coating thickness gauges ideal for laboratory and field Use. Available in ferrous only configuation, non-ferrous only, and a combination model that measures on both ferrous and non-ferrous substrates.
(800)645-4330, (516)295-4300 FAX: (516)295-4399, E-mail: Request a quote

ELEKTRO-PHYSIK USA - Arlington Heights, IL - - Leading manufacturer of coating thickness testing gauges, offering a broad range of products for your finishing related quality control needs, including viscosity, color, gloss, opacity, film application and a variety of physical tests common to this industry. Purchase many of our products online by clicking on the shopping cart icon.
(800)782-1506, (847)437-6616, Fax: (847)437-0053, E-mail: Request a quote

FILMETRICS, INC. - San Diego, CA - - Affordable and easy-to-use instruments for measuring film thickness (30Ĺ to 13mm), index of refraction, and deposition rates. Wavelengths available from 200nm to 1700nm. Configurations available for tabletop, in-situ, and in-line applications. Instruments for the semiconductor market, from robust, ultra-fast patterned wafer measurements to automated thickness mapping of unpatterned wafer.
(858)573-9300, Fax: (858)573-9400, E-mail: Request a quote

FOOTHILL INSTRUMENTS, LLC - La Canada, CA - - Tabletop metrology tools for measuring Si, GaAs, resist, ... of thickness range 20 µm to 500+ µm (Si) or > 1 mm of resist. Ideal for process control of backthinned Si. Our products are also available in component form to allow easy integration or clustering with other tools. Very compact design enables in-process metrology.
(818)952-5600, Fax: (000)573-9400, E-mail: Request a quote

GARDCO - Pompano Beach, FL - - The Paul N. Gardner Company offers thousands of products for the paint, coatings and related industries. This site contains only a few of our new and featured items. A complete product list can be viewed on our Catalog Index Pages, or you can request our Catalog.
(800)762-2478, (954)946-9454, Fax: (954)946-9309, E-mail: Request a quote

HORIBA SCIENTIFIC - Edison, NJ - - Manufacturers of a wide range of spectroscopic ellipsometers used for the characterization of multi-layer film thickness, optical constants, and materials composition analysis. HORIBA products offer the highest level of accuracy and sensitivity for demanding applications. We also offer high-performance Raman, FLIM and EDXRF microscopes for rapid spectroscopy and imaging measurements.
(732)494-8660, Fax: (732)623-8129, E-mail: Request a quote

KLA-TENCOR CORPORATION - San Jose, CA - - Integrating new films, such as photoresists, anti-reflective coatings, and dielectrics, into the production process requires comprehensive films metrology. KLA-Tencor uses optical and electrical measurement technology to control dielectric film thickness, charge composition, and electrical interface quality, minimizing the risk to device electrical performance and ensuring accelerated yield.
(408)875-3000, Fax: (408)875-4144, E-mail: Request a quote

KOCOUR CO. - Chicago, IL - - Serving the metal finishing industry with products that improve function, quality, and appearance, Kocour packs increased capability into our thickness testers in a compact, easy-to-use, quick-learning instrument. The 6000 breaks new ground and sets new standards in accuracy and performance with an exceptional combination of capability and price.
(800)538-0554, (773)847-1111, Fax: (773)847-3399, E-mail: Request a quote

LUZCHEM RESEARCH, INC. - Ottawa, ON, Canada - - Luzchem's TFA-11 instrument combines the power of interferometric measurements of dry and wet thin film thickness, with a versatile, cost effective dissolution rate monitor. Multiple measurements are possible in a single wafer; typically 4 in a 3 inch wafer and over 30 in an 8 inch wafer.
(800)397-0977, (613)749-2442, Fax: (613)749-2393, E-mail: Request a quote

MATRIX METROLOGIES, INC. - Holbrook, NY - - XRF film thickness and material composition measurement - Matrix Metrologies is a supplier of film measurement equipment and services used to determine the thickness and composition of metal depositions commonly employed in the metal finishing and microelectronics industries. Our products are used in production, incoming quality, product development and failure analysis.
(631)472.2400, Fax: (631)472-2424, E-mail: Request a quote

MAXTEK, INC. - Cypress CA - - Innovative thin film deposition measurement and Quartz Crystal Microbalance (QCM) measurement instruments and accessories, including quartz crystals, thin film deposition monitors and thin film controllers and accessories. Our instruments Provide much more capability than simple Deposition Monitors in the form of additional displays, Real-Time graphs, and programmable inputs and outputs.
(714)828-4200, Fax: (714)828-4443, E-mail: Request a quote - Cornelius, NC - - Thickness gauges for precision measurements of films, foils, papers, paint and other coatings. Measure any polymer film with sub micron accuracy in an instant with our remarkable Z500 gauge. Easy to use, instant thickness, high/low limits, lab or process measurements. Simple to calibrate, can save your data directly to a PC.
(704)895-2548, Fax: (866)407-5325, E-mail: Request a quote

MICRO PHOTONICS, INC. - Allentown, PA - - Dual scanning profilometer for double side non-contact profiling and simultaneous thickness measurement with nanometer resolution. Small pocket sized coating thickness gauges with integrated probe for measurements on ferrous and non-ferrous materials includes automatic substrate recognition. Complete data logging system capable of storing up to 10,000 readings for statistical evaluation.
(866)334-4674, (610)366-7103, Fax: (610)366-7105, E-mail: Request a quote

OLYMPUS-NDT - Waltham, MA - - Precision, handheld thickness gages - Olympus NDT provides an industry-leading portfolio of ultrasound, phased array, eddy current, and eddy current array nondestructive coating thickness testing technologies. We are committed to actively pursuing the development of new technologies, products, and services that offer the best solutions to customers' needs.
(800)225-8330, (781)419-3900, Fax: (781)419-3980, E-mail: Request a quote

PANalytical, INC. - Natick, MA - - Thin film X-Ray metrology tools ranging from the X'Pert PRO MRD for semiconductor research and development labs, to the PW2830 Wafer Analyzer for pilot and volume production. The PANalytical approach simplifies the hand-over from R&D to pilot, to volume production lines in the silicon, data storage and compound industries.
(800)279-7297, (508)647-1100, Fax: (508)647-1115, E-mail: Request a quote

> RIGAKU AMERICAS - The Woodlands, TX - - Rigaku X-ray based measurement tools enable everything from in-FAB process control metrology to research & development for thin film and materials characterization. Our Semiconductor Division specializes in making XRF, XRD and XRR metrology tools to measure critical process parameters like thin film: thickness, composition, roughness, density, porosity, and crystal structure.
(281)362-2300, FAX: (281)364-3628 , E-mail: Request a quote

SCIENTIFIC COMPUTING INTERNATIONAL - Carlsbad, CA - - Raising thin film metrology performance to a new level. FilmTek™ metrology systems can measure a broad array of single and multi-layer films including metallic, semiconductor, amorphous, crystalline, and dielectric materials on virtually any substrate to determine multiple layer thicknesses (from <1Ĺ to 250 microns), surface roughness, damage, wafer curvature, film stress and more.
(760)634-3822, Fax: (760)634-3826, E-mail: Request a quote

SEMICONSOFT, INC. - Southborough, MA - - Wide range of optical thin-film metrology instruments from high-precision sophisticated ellipsometry and reflectometry systems (spectroscopic, fast single wavelength and Imaging) for research and production applications to low-budget reflectometers for variety of applications. Providing the most sophisticated and user-friendly data analysis software that supports reflectance, transmittance, ellipsometry and imaging analysis.
(617)388-6832, Fax: (603)710-7717, E-mail: Request a quote

SOLVETECH, INC. - Wilmington, DE - - A leader in the design and application of non-contact thickness/basis weight gauging systems for plastic films and other non-conductive materials, such as ceramics, non-wovens, and paper. Our products are avilable for both on-line and off-line lab use. Measurements are non-contacting, high precision, and offer a high speed of response.
(302)798-5400, E-mail: Request a quote

TECHNOS INTERNATIONAL, INC. - Tempe, AZ - - World leader in applying analytical x-ray metrology tools and solutions for the semiconductor industry, including the TVD 910, and S-MAT thin film metrology product line. With 20 years experience, Technos has gained valuable expertise in analytical x-ray applications for the semiconductor industry via the strength of our worldwide installed base.
(866)832-4666, (480)775-4100, Fax: (866)832-4666, E-mail: Request a quote

TESTING MACHINES, INC. - Ronkonkoma, NY - - Instruments to measure the physical properties of materials including pulp and paper, film, foil, ink, coatings, nonwovens, plastic, rubber, textile, adhesives, ceramic, metal and corrugated. Measure more than 50 properties including adhesion, abrasion, friction, compression, tensile strength, impact, internal bond, softness and thickness. TestLink data acquisition software is available.
(800)678-3221, (631)439-5400, Fax: (631)439-5420, E-mail: Request a quote

THERMO FISHER SCIENTIFIC / Environmental Instruments - Franklin, MA - - Parallel angle resolved XPS systems for ultra-thin film thickness and chemical state mapping with our Theta 300 analyzer for 300 mm wafers. Process and defect engineers now have a quick reference to our capabilities in trace chemical analysis, metrology, microspectroscopy and numerous X-ray techniques for wafer, thin-film and surface analysis.
(800)678-3221, (631(866)282-0430, (508)553-6850, Fax: (508)520-1460 Request a quote

VEECO METROLOGY, INC. - Tucson, AZ - - The Wyko NT9300 utilizes Veeco’s ninth-generation optical profiling sensor technology to provide fast, highly accurate 3D surface topography measurements from 0.1 nanometer up to 10 millimeters. The extended, large scan capability makes this system ideal for large-region, stitched, and irregular samples.
(520)741-1044, Fax: (520)294-1799 Request a quote


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