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FILMETRICS, INC. - San Diego, CA - -
Affordable and easy-to-use instruments for measuring film thickness (30Ĺ to 13mm), index of refraction, and deposition rates. Wavelengths available from 200nm to 1700nm. Configurations available for tabletop, in-situ, and in-line applications. Instruments for the semiconductor market, from robust, ultra-fast patterned wafer measurements to automated thickness mapping of unpatterned wafer.
, Fax: (858)573-9400, E-mail: Mailto_Fi@filmetrics.com Request a quote
FOOTHILL INSTRUMENTS, LLC - La Canada, CA - - Tabletop metrology tools for measuring Si, GaAs, resist, ... of thickness range 20 µm to 500+ µm (Si) or > 1 mm of resist. Ideal for process control of backthinned Si. Our products are also available in component form to allow easy integration or clustering with other tools. Very compact design enables in-process metrology.
(818)952-5600, Fax: (000)573-9400, E-mail: firstname.lastname@example.org Request a quote
HORIBA SCIENTIFIC - Edison, NJ - - Manufacturers of a wide range of spectroscopic ellipsometers used for the characterization of multi-layer film thickness, optical constants, and materials composition analysis. HORIBA products offer the highest level of accuracy and sensitivity for demanding applications. We also offer high-performance Raman, FLIM and EDXRF microscopes for rapid spectroscopy and imaging measurements
, Fax: (732)623-8129, E-mail: Joanne.Lowy@Horiba.com Request a quote
KLA-TENCOR CORPORATION - San Jose, CA - - Integrating new films, such as photoresists, anti-reflective coatings, and dielectrics, into the production process requires comprehensive films metrology. KLA-Tencor uses optical and electrical measurement technology to control dielectric film thickness, charge composition, and electrical interface quality, minimizing the risk to device electrical performance and ensuring accelerated yield.
(408)875-3000, Fax: (408)875-4144, E-mail: email@example.com Request a quote
MATRIX METROLOGIES, INC. - Holbrook, NY - - XRF film thickness and material composition measurement - Matrix Metrologies is a supplier of film measurement equipment and services used to determine the thickness and composition of metal depositions commonly employed in the metal finishing and microelectronics industries. Our products are used in production, incoming quality, product development and failure analysis.
(631)472.2400, Fax: (631)472-2424, E-mail: firstname.lastname@example.org Request a quote
MAXTEK, INC. - Cypress CA - - Innovative thin film deposition measurement and Quartz Crystal Microbalance (QCM) measurement instruments and accessories, including quartz crystals, thin film deposition monitors and thin film controllers and accessories. Our instruments Provide much more capability than simple Deposition Monitors in the form of additional displays, Real-Time graphs, and programmable inputs and outputs
(714)828-4200, Fax: (714)828-4443, E-mail: email@example.com Request a quote
SCIENTIFIC COMPUTING INTERNATIONAL - Carlsbad, CA - - Raising thin film metrology performance to a new level. FilmTek™ metrology systems can measure a broad array of single and multi-layer films including metallic, semiconductor, amorphous, crystalline, and dielectric materials on virtually any substrate to determine multiple layer thicknesses (from <1Ĺ to 250 microns), surface roughness, damage, wafer curvature, film stress and more.
VISIT ALSO: www.CoatingThicknessInstruments.com
VISIT ALSO: www.FilmThicknessMetrology.com
, Fax: (760)634-3826, E-mail: firstname.lastname@example.org Request a quote
SEMICONSOFT, INC. - Southborough, MA - - Wide range of optical thin-film metrology instruments from high-precision sophisticated ellipsometry and reflectometry systems (spectroscopic, fast single wavelength and Imaging) for research and production applications to low-budget reflectometers for variety of applications. Providing the most sophisticated and user-friendly data analysis software that supports reflectance, transmittance, ellipsometry and imaging analysis.
(617)388-6832, Fax: (603)710-7717, E-mail: email@example.com Request a quote
TECHNOS INTERNATIONAL, INC. - Tempe, AZ - - World leader in applying analytical x-ray metrology tools and solutions for the semiconductor industry, including the TVD 910, and S-MAT thin film metrology product line. With 20 years experience, Technos has gained valuable expertise in analytical x-ray applications for the semiconductor industry via the strength of our worldwide installed base.
(866)832-4666, (480)775-4100, Fax: (866)832-4666, E-mail: firstname.lastname@example.org Request a quote
THERMO FISHER SCIENTIFIC / Environmental Instruments - Franklin, MA - - Parallel angle resolved XPS systems for ultra-thin film thickness and chemical state mapping with our Theta 300 analyzer for 300 mm wafers. Process and defect engineers now have a quick reference to our capabilities in trace chemical analysis, metrology, microspectroscopy and numerous X-ray techniques for wafer, thin-film and surface analysis.
(800)678-3221, (631(866)282-0430, (508)553-6850, Fax: (508)520-1460 email@example.com Request a quote
VEECO METROLOGY, INC. - Tucson, AZ - -
The Wyko NT9300 utilizes Veeco’s ninth-generation optical profiling sensor technology to provide fast, highly accurate 3D surface topography measurements from 0.1 nanometer up to 10 millimeters. The extended, large scan capability makes this system ideal for large-region, stitched, and irregular samples.
(520)741-1044, Fax: (520)294-1799 firstname.lastname@example.org Request a quote
VISIT ALSO: www.SputteringDeposition.com
VISIT ALSO: www.ThinFilmFoundries.com
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