FILMETRICS, INC. - San Diego, CA - -
Affordable and easy-to-use instruments for measuring film thickness (30Å to 13mm), index of refraction, and deposition rates. Wavelengths available from 200nm to 1700nm. Configurations available for tabletop, in-situ, and in-line applications. Instruments for the semiconductor market, from robust, ultra-fast patterned wafer measurements to automated thickness mapping of unpatterned wafer.
You may enter your keywords above to find the very best available domain names ~ Example: electronics
Proceeds from sale of surplus TDE domain names allows us to finance our own domain acquisition program