WAFER SURFACE ANALYZERS
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FILMETRICS, INC. - San Diego, CA - -
Affordable and easy-to-use instruments for measuring film thickness (30Å to 13mm), index of refraction, and deposition rates. Wavelengths available from 200nm to 1700nm. Configurations available for tabletop, in-situ, and in-line applications. Instruments for the semiconductor market, from robust, ultra-fast patterned wafer measurements to automated thickness mapping of unpatterned wafer.
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