Film Thickness Instruments - www.FilmThicknessInstruments.com

BRUNSWICK INSTRUMENT, INC. - Niles, IL - - Manufacturer of digital electronic gages for precision film / foil / paper thickness measurement & inspection. Fixed & variable contact force models. Data outputs. High resolution thickness measurement. Special application test stands.

(847)965-9191, Fax: (847)965-9193, E-mail: info@brunswickinstrument.com

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FILMETRICS, INC. - San Diego, CA - - Affordable and easy-to-use instruments for measuring film thickness (30Å to 13mm), index of refraction, and deposition rates. Wavelengths available from 200nm to 1700nm. Configurations available for tabletop, in-situ, and in-line applications. Instruments for the semiconductor market, from robust, ultra-fast patterned wafer measurements to automated thickness mapping of unpatterned wafer.

(858)573-9300, Fax: (858)573-9400, E-mail: Mailto_Fi@filmetrics.com

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FISCHER TECHNOLOGY, INC. - Windsor, CT - - Designers and manufacturers of coating thickness gauges & instruments, material testing instruments, hardness testing and material analysis instruments - The result of years of industry experience and extensive research. FISCHER provides a large variety of testing & analysis instruments for virtually any type of coating thickness related application, material testing and hardness testing.
(800)243-8417, (860)683-0781, FAX: (860)688-8496, E-mail: Info@Fischer-Technology.com

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HORIBA SCIENTIFIC - Edison, NJ - - Manufacturers of a wide range of spectroscopic ellipsometers used for the characterization of multi-layer film thickness, optical constants, and materials composition analysis. HORIBA products offer the highest level of accuracy and sensitivity for demanding applications. We also offer high-performance Raman, FLIM and EDXRF microscopes for rapid spectroscopy and imaging measurements.

(732)494-8660, Fax: (732)623-8129, E-mail: Joanne.Lowy@Horiba.com

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SCIENTIFIC COMPUTING INTERNATIONAL - Carlsbad, CA - - Raising thin film metrology performance to a new level. FilmTek™ metrology systems can measure a broad array of single and multi-layer films including metallic, semiconductor, amorphous, crystalline, and dielectric materials on virtually any substrate to determine multiple layer thicknesses (from <1Å to 250 microns), surface roughness, damage, wafer curvature, film stress and more.

(760)634-3822, Fax: (760)634-3826, E-mail: info@sci-soft.com

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